Aticleworld
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Latest posts
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Electrical Fast Transient (EFT) Testing: IEC 61000-4-4 and Practical EMC Design Guidelines
Electrical Fast Transient (EFT) testing is an essential electromagnetic compatibility (EMC) immunity test used to evaluate whether electronic equipment can operate reliably in the presence of repetitive, fast electrical disturbances. Defined by IEC 61000-4-4, this test simulates…
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Designing High-Speed SPI: The Pitfalls of Open-Drain Buffers and Pull-Ups
Serial Peripheral Interface (SPI) is widely used in embedded systems to communicate with external Flash memory, displays, ADCs, sensors, and other peripherals. Its simple architecture, full-duplex communication, and support for high data rates make it a popular choice in…
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ADC Interview Questions and Answers: Basic to Advanced
Analog-to-Digital Converters (ADCs) are used in almost every embedded system where a microcontroller needs to work with real-world signals such as voltage, temperature, current, or sensor data. Because of this, ADC interview questions are very common in embedded systems and…
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Understanding Atomic Read-Modify-Write in ARM Cortex-M
Have you ever written REG |= BIT and assumed it was a safe way to set a bit? It certainly looks like a single operation. However, on an ARM Cortex-M processor, the CPU actually performs it in three steps: read, modify, and write. If an interrupt happens between these steps and…